. . "Semiconductor device modeling"@en . "FLUID" . . "Group III-nitrides"@en . "Epitaxial growth"@en . "Monte Carlo simulation"@en . "Scanning electron microscope SEM"@en . "Didier Theron" . "Nanotechnologie"@fr . "HEMTs"@en . "III-V semiconductors"@en . "Substrates"@en . "Ohmic contacts"@en . "PLASMA-WAVES"@en . "Current measurement"@en . "Optomechanics"@en . "Neuronal modeller" . "Parasitic capacitance"@en . "CNTFETs"@en . "Nanoparticles"@en . "Near-Field scanning microwave microscopy NSMM"@en . "LSNA" . "Power transistors"@en . "Electrical characterization"@en . . "Finite-element analysis"@en . "Optical resonators"@en . "Finite element method FEM"@en . "RF nanotechnology"@en . "Aluminium compounds"@en . "Intermodulation"@en . "Charge carrier density"@en . "Atomic force microscopy AFM"@en . "Frequency"@en . "Standard operating procedure"@en . "Semiconductor devices"@en . "Organic photovoltaics"@en . "Molecular electronics"@en . "Microwave theory and techniques"@en . "Extreme impedance"@en . "RESONANT DETECTION"@en . "RADIATION"@en . "Didier" . "PLASMON MODES"@en . "Scanning microwave microscopy"@en . "NEMS"@en . "Boundary conditions"@en . "ELECTRON-MOBILITY TRANSISTORS"@en . "SUB-TERAHERTZ"@en . "Conducting materials"@en . "Microwave measurements"@en . <0000-0002-3264-6338> . <059916567> . "Non linear model" . "Mach-Zehnder interferometer detection unit"@en . . . "Electromagnetic modeling"@en . "MEMS"@en . "Wide band gap semiconductors"@en . "Doping"@en . "Logic gates"@en . "Scanning electron microscopy"@en . "Impact ionization"@en . "Field-effect transistors"@en . "MHEMTs"@en . "Gallium arsenide"@en . "Defects"@en . "Theron" . "Ndium compounds"@en . "Millimeter-wave"@en . "Current density"@en . . "Gold"@en . "Finite elements modeling FEM"@en . . . "8440-x"@en . . "Frequency measurement"@en . . "Microwave devices"@en . "Atomic force microscopy"@en . "TeraHertz detectors"@en . "Scanning electron microscopy SEM"@en . "Charge transport"@en . "Electrons"@en . "MOS devices"@en . "FIELD-EFFECT TRANSISTOR"@en . "Gallium compounds"@en . "Power generation"@en . "SUBTERAHERTZ RADIATION"@en . "Plasma waves"@en . "Multiport vector network analyzer"@en . "Micromechanical devices"@en . "CNFET" . "Kelvin probe force microscopy"@en . "Hybrid perovskite"@en . "Gallium nitride"@en . "Coupled quantum dot"@en . "Millimeter waves"@en . "Resonator"@en . "Microwave transistors"@en . "Near-Field Scanning Microwave Microscopy"@en . "MODFETs"@en . "57e55670bcf6d4e3cf65a25323ea7bd4" . "Large-scale systems"@en . "Microwave interferometry"@en . "Indium phosphide"@en . . "Nanoelectrochemistry"@en . . "Interferometry"@en . "Cooperative effect"@en . . "Nanotechnology applications"@en . "Heterojunctions"@en . "Heterostructure AlGaN/GaN"@en . "High electron mobility transistors"@en . "Imaging"@en . "Aluminum gallium nitride"@en .