https://data.archives-ouvertes.fr/author/735900

https://data.archives-ouvertes.fr/author/735900

http://xmlns.com/foaf/0.1/topic_interest Transients
http://xmlns.com/foaf/0.1/topic_interest QKD
http://xmlns.com/foaf/0.1/topic_interest Quantum
http://xmlns.com/foaf/0.1/topic_interest Radiation effects
http://xmlns.com/foaf/0.1/topic_interest Soft error
http://xmlns.com/foaf/0.1/topic_interest Fault tolerant systems
http://xmlns.com/foaf/0.1/topic_interest Side channels
http://xmlns.com/foaf/0.1/topic_interest Low power
http://xmlns.com/foaf/0.1/topic_interest Built-in current sensors
http://xmlns.com/foaf/0.1/topic_interest Inertial Navigation System
http://xmlns.com/foaf/0.1/topic_interest Single-event functional interrupts SEFI
http://xmlns.com/foaf/0.1/topic_interest Machine learning algorithm
http://xmlns.com/foaf/0.1/topic_interest Cryptography
http://xmlns.com/foaf/0.1/mbox_sha1sum e06c34166a9dc3f404e1c1331d641bda
http://xmlns.com/foaf/0.1/topic_interest Single soft error detection
http://xmlns.com/foaf/0.1/topic_interest Harware Trojan
http://xmlns.com/foaf/0.1/topic_interest Entanglement
http://xmlns.com/foaf/0.1/topic_interest Hardware security
http://xmlns.com/foaf/0.1/topic_interest Fault simulation
http://xmlns.com/foaf/0.1/topic_interest FPGA
http://xmlns.com/foaf/0.1/topic_interest Transient-fault detection
http://xmlns.com/foaf/0.1/topic_interest Hardware Trojan
http://xmlns.com/foaf/0.1/familyName Possamai Bastos
http://xmlns.com/foaf/0.1/topic_interest Run-time test
http://xmlns.com/foaf/0.1/topic_interest Detection-of-faults
http://xmlns.com/foaf/0.1/topic_interest Error detection codes
http://xmlns.com/foaf/0.1/topic_interest Transient faults
http://xmlns.com/foaf/0.1/topic_interest Support vector machine
http://xmlns.com/foaf/0.1/topic_interest Concurrent error dectection codes
http://xmlns.com/foaf/0.1/topic_interest Radiation test
http://xmlns.com/foaf/0.1/topic_interest Body biasing
http://xmlns.com/foaf/0.1/topic_interest Clocks
http://xmlns.com/foaf/0.1/topic_interest Current signature
http://xmlns.com/foaf/0.1/topic_interest CMOS Transistors
http://xmlns.com/foaf/0.1/topic_interest Circuit and system radiation hardening and mitigation
http://xmlns.com/foaf/0.1/topic_interest Transcient fault
http://xmlns.com/foaf/0.1/topic_interest Security
http://xmlns.com/foaf/0.1/topic_interest Asynchronous circuits
http://xmlns.com/foaf/0.1/topic_interest Bulk Built-In Current Sensors
http://xmlns.com/foaf/0.1/topic_interest Soft Error
http://xmlns.com/foaf/0.1/name Rodrigo Possamai Bastos
http://xmlns.com/foaf/0.1/topic_interest QDI circuits
http://xmlns.com/foaf/0.1/topic_interest Level shifter
http://xmlns.com/foaf/0.1/topic_interest Long-duration transient faults
http://xmlns.com/foaf/0.1/topic_interest Soft errors
http://xmlns.com/foaf/0.1/topic_interest Laser fault injection
http://xmlns.com/foaf/0.1/interest https://data.archives-ouvertes.fr/subject/spi.nano
http://xmlns.com/foaf/0.1/topic_interest Trojan detection
http://xmlns.com/foaf/0.1/topic_interest Logic circuits
http://xmlns.com/foaf/0.1/interest https://data.archives-ouvertes.fr/subject/spi.tron
http://xmlns.com/foaf/0.1/firstName Rodrigo
http://xmlns.com/foaf/0.1/topic_interest Bulk built-In Current Sensor
http://xmlns.com/foaf/0.1/topic_interest Single Event Upset
http://xmlns.com/foaf/0.1/topic_interest Fault-tolerance
http://xmlns.com/foaf/0.1/topic_interest FDSOI
http://xmlns.com/foaf/0.1/topic_interest Concurrent detection
http://xmlns.com/foaf/0.1/topic_interest Circuits asynchrones
http://xmlns.com/foaf/0.1/topic_interest Fault detection
http://xmlns.com/foaf/0.1/topic_interest Transient-fault
http://xmlns.com/foaf/0.1/topic_interest SEU
http://xmlns.com/foaf/0.1/topic_interest Local body-biasing techniques
http://xmlns.com/foaf/0.1/topic_interest Fautes transitoires
http://xmlns.com/foaf/0.1/topic_interest Concurrent error detection schemes
http://xmlns.com/foaf/0.1/topic_interest Concurrent error detection
http://xmlns.com/foaf/0.1/topic_interest CubeSat
http://xmlns.com/foaf/0.1/topic_interest Electrical simulation
http://xmlns.com/foaf/0.1/topic_interest Circuit faults
http://xmlns.com/foaf/0.1/topic_interest Attitude Estimation
http://xmlns.com/foaf/0.1/topic_interest Laser
http://xmlns.com/foaf/0.1/topic_interest Transient fault
http://xmlns.com/foaf/0.1/topic_interest Machine learning
http://www.w3.org/2002/07/owl#sameAs 0000-0002-9964-0424
http://www.w3.org/2002/07/owl#sameAs 147702321
http://xmlns.com/foaf/0.1/topic_interest Quasi-delay insensitive
http://xmlns.com/foaf/0.1/topic_interest Asynchronous circuit
http://xmlns.com/foaf/0.1/topic_interest Fault tolerance
http://xmlns.com/foaf/0.1/topic_interest Radiation-induced soft errors
http://xmlns.com/foaf/0.1/topic_interest Integrated circuit
http://xmlns.com/foaf/0.1/topic_interest Systèmes robustes
http://xmlns.com/foaf/0.1/topic_interest Timing
http://xmlns.com/foaf/0.1/topic_interest AES
http://xmlns.com/foaf/0.1/topic_interest Methodologies for EDA
http://xmlns.com/foaf/0.1/interest https://data.archives-ouvertes.fr/subject/spi.auto
http://xmlns.com/foaf/0.1/topic_interest Built-in-current-sensor
http://xmlns.com/foaf/0.1/topic_interest Test
http://xmlns.com/foaf/0.1/topic_interest Transient-faults
http://xmlns.com/foaf/0.1/topic_interest Single-event upsets SEU
http://xmlns.com/foaf/0.1/topic_interest And security
http://www.w3.org/1999/02/22-rdf-syntax-ns#type http://xmlns.com/foaf/0.1/Person
http://xmlns.com/foaf/0.1/topic_interest CED code-based scheme
http://xmlns.com/foaf/0.1/topic_interest Registers
http://xmlns.com/foaf/0.1/topic_interest Sensor
http://xmlns.com/foaf/0.1/topic_interest Ir-drop
http://xmlns.com/foaf/0.1/topic_interest Fault attacks
http://xmlns.com/foaf/0.1/topic_interest Thermal neutrons
http://xmlns.com/foaf/0.1/topic_interest Clockless circuit
http://xmlns.com/foaf/0.1/topic_interest Logic circuit
http://xmlns.com/foaf/0.1/topic_interest Transient-faults-sensitivity-evaluation
http://xmlns.com/foaf/0.1/topic_interest Design
http://www.openarchives.org/ore/terms/isAggregatedBy https://data.archives-ouvertes.fr/author/rpbastos
http://xmlns.com/foaf/0.1/topic_interest Hardware security implementation
http://xmlns.com/foaf/0.1/topic_interest Integrated circuit modeling
http://xmlns.com/foaf/0.1/topic_interest Reliability
http://xmlns.com/foaf/0.1/topic_interest Built-in-sensor
http://xmlns.com/foaf/0.1/topic_interest Short-duration single transient fault
http://xmlns.com/foaf/0.1/topic_interest Satellite
http://xmlns.com/foaf/0.1/topic_interest Systems
http://xmlns.com/foaf/0.1/topic_interest FAULT INJECTION
http://xmlns.com/foaf/0.1/topic_interest Transient analysis
http://xmlns.com/foaf/0.1/topic_interest Field-programmable-gate-arrays
http://xmlns.com/foaf/0.1/topic_interest Transient-effects
http://xmlns.com/foaf/0.1/topic_interest Concurrent error detection code-based scheme
http://xmlns.com/foaf/0.1/topic_interest Recovery schemes
http://xmlns.com/foaf/0.1/topic_interest Built-in current sensor
http://xmlns.com/foaf/0.1/topic_interest Transient current
http://xmlns.com/foaf/0.1/topic_interest QDI

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