dataHAL.science
Support
https://data.archives-ouvertes.fr/author/735900
https://data.archives-ouvertes.fr/author/735900
http://xmlns.com/foaf/0.1/topic_interest
Transients
http://xmlns.com/foaf/0.1/topic_interest
QKD
http://xmlns.com/foaf/0.1/topic_interest
Quantum
http://xmlns.com/foaf/0.1/topic_interest
Radiation effects
http://xmlns.com/foaf/0.1/topic_interest
Soft error
http://xmlns.com/foaf/0.1/topic_interest
Fault tolerant systems
http://xmlns.com/foaf/0.1/topic_interest
Side channels
http://xmlns.com/foaf/0.1/topic_interest
Low power
http://xmlns.com/foaf/0.1/topic_interest
Built-in current sensors
http://xmlns.com/foaf/0.1/topic_interest
Inertial Navigation System
http://xmlns.com/foaf/0.1/topic_interest
Single-event functional interrupts SEFI
http://xmlns.com/foaf/0.1/topic_interest
Machine learning algorithm
http://xmlns.com/foaf/0.1/topic_interest
Cryptography
http://xmlns.com/foaf/0.1/mbox_sha1sum
e06c34166a9dc3f404e1c1331d641bda
http://xmlns.com/foaf/0.1/topic_interest
Single soft error detection
http://xmlns.com/foaf/0.1/topic_interest
Harware Trojan
http://xmlns.com/foaf/0.1/topic_interest
Entanglement
http://xmlns.com/foaf/0.1/topic_interest
Hardware security
http://xmlns.com/foaf/0.1/topic_interest
Fault simulation
http://xmlns.com/foaf/0.1/topic_interest
FPGA
http://xmlns.com/foaf/0.1/topic_interest
Transient-fault detection
http://xmlns.com/foaf/0.1/topic_interest
Hardware Trojan
http://xmlns.com/foaf/0.1/familyName
Possamai Bastos
http://xmlns.com/foaf/0.1/topic_interest
Run-time test
http://xmlns.com/foaf/0.1/topic_interest
Detection-of-faults
http://xmlns.com/foaf/0.1/topic_interest
Error detection codes
http://xmlns.com/foaf/0.1/topic_interest
Transient faults
http://xmlns.com/foaf/0.1/topic_interest
Support vector machine
http://xmlns.com/foaf/0.1/topic_interest
Concurrent error dectection codes
http://xmlns.com/foaf/0.1/topic_interest
Radiation test
http://xmlns.com/foaf/0.1/topic_interest
Body biasing
http://xmlns.com/foaf/0.1/topic_interest
Clocks
http://xmlns.com/foaf/0.1/topic_interest
Current signature
http://xmlns.com/foaf/0.1/topic_interest
CMOS Transistors
http://xmlns.com/foaf/0.1/topic_interest
Circuit and system radiation hardening and mitigation
http://xmlns.com/foaf/0.1/topic_interest
Transcient fault
http://xmlns.com/foaf/0.1/topic_interest
Security
http://xmlns.com/foaf/0.1/topic_interest
Asynchronous circuits
http://xmlns.com/foaf/0.1/topic_interest
Bulk Built-In Current Sensors
http://xmlns.com/foaf/0.1/topic_interest
Soft Error
http://xmlns.com/foaf/0.1/name
Rodrigo Possamai Bastos
http://xmlns.com/foaf/0.1/topic_interest
QDI circuits
http://xmlns.com/foaf/0.1/topic_interest
Level shifter
http://xmlns.com/foaf/0.1/topic_interest
Long-duration transient faults
http://xmlns.com/foaf/0.1/topic_interest
Soft errors
http://xmlns.com/foaf/0.1/topic_interest
Laser fault injection
http://xmlns.com/foaf/0.1/interest
https://data.archives-ouvertes.fr/subject/spi.nano
http://xmlns.com/foaf/0.1/topic_interest
Trojan detection
http://xmlns.com/foaf/0.1/topic_interest
Logic circuits
http://xmlns.com/foaf/0.1/interest
https://data.archives-ouvertes.fr/subject/spi.tron
http://xmlns.com/foaf/0.1/firstName
Rodrigo
http://xmlns.com/foaf/0.1/topic_interest
Bulk built-In Current Sensor
http://xmlns.com/foaf/0.1/topic_interest
Single Event Upset
http://xmlns.com/foaf/0.1/topic_interest
Fault-tolerance
http://xmlns.com/foaf/0.1/topic_interest
FDSOI
http://xmlns.com/foaf/0.1/topic_interest
Concurrent detection
http://xmlns.com/foaf/0.1/topic_interest
Circuits asynchrones
http://xmlns.com/foaf/0.1/topic_interest
Fault detection
http://xmlns.com/foaf/0.1/topic_interest
Transient-fault
http://xmlns.com/foaf/0.1/topic_interest
SEU
http://xmlns.com/foaf/0.1/topic_interest
Local body-biasing techniques
http://xmlns.com/foaf/0.1/topic_interest
Fautes transitoires
http://xmlns.com/foaf/0.1/topic_interest
Concurrent error detection schemes
http://xmlns.com/foaf/0.1/topic_interest
Concurrent error detection
http://xmlns.com/foaf/0.1/topic_interest
CubeSat
http://xmlns.com/foaf/0.1/topic_interest
Electrical simulation
http://xmlns.com/foaf/0.1/topic_interest
Circuit faults
http://xmlns.com/foaf/0.1/topic_interest
Attitude Estimation
http://xmlns.com/foaf/0.1/topic_interest
Laser
http://xmlns.com/foaf/0.1/topic_interest
Transient fault
http://xmlns.com/foaf/0.1/topic_interest
Machine learning
http://www.w3.org/2002/07/owl#sameAs
0000-0002-9964-0424
http://www.w3.org/2002/07/owl#sameAs
147702321
http://xmlns.com/foaf/0.1/topic_interest
Quasi-delay insensitive
http://xmlns.com/foaf/0.1/topic_interest
Asynchronous circuit
http://xmlns.com/foaf/0.1/topic_interest
Fault tolerance
http://xmlns.com/foaf/0.1/topic_interest
Radiation-induced soft errors
http://xmlns.com/foaf/0.1/topic_interest
Integrated circuit
http://xmlns.com/foaf/0.1/topic_interest
Systèmes robustes
http://xmlns.com/foaf/0.1/topic_interest
Timing
http://xmlns.com/foaf/0.1/topic_interest
AES
http://xmlns.com/foaf/0.1/topic_interest
Methodologies for EDA
http://xmlns.com/foaf/0.1/interest
https://data.archives-ouvertes.fr/subject/spi.auto
http://xmlns.com/foaf/0.1/topic_interest
Built-in-current-sensor
http://xmlns.com/foaf/0.1/topic_interest
Test
http://xmlns.com/foaf/0.1/topic_interest
Transient-faults
http://xmlns.com/foaf/0.1/topic_interest
Single-event upsets SEU
http://xmlns.com/foaf/0.1/topic_interest
And security
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://xmlns.com/foaf/0.1/Person
http://xmlns.com/foaf/0.1/topic_interest
CED code-based scheme
http://xmlns.com/foaf/0.1/topic_interest
Registers
http://xmlns.com/foaf/0.1/topic_interest
Sensor
http://xmlns.com/foaf/0.1/topic_interest
Ir-drop
http://xmlns.com/foaf/0.1/topic_interest
Fault attacks
http://xmlns.com/foaf/0.1/topic_interest
Thermal neutrons
http://xmlns.com/foaf/0.1/topic_interest
Clockless circuit
http://xmlns.com/foaf/0.1/topic_interest
Logic circuit
http://xmlns.com/foaf/0.1/topic_interest
Transient-faults-sensitivity-evaluation
http://xmlns.com/foaf/0.1/topic_interest
Design
http://www.openarchives.org/ore/terms/isAggregatedBy
https://data.archives-ouvertes.fr/author/rpbastos
http://xmlns.com/foaf/0.1/topic_interest
Hardware security implementation
http://xmlns.com/foaf/0.1/topic_interest
Integrated circuit modeling
http://xmlns.com/foaf/0.1/topic_interest
Reliability
http://xmlns.com/foaf/0.1/topic_interest
Built-in-sensor
http://xmlns.com/foaf/0.1/topic_interest
Short-duration single transient fault
http://xmlns.com/foaf/0.1/topic_interest
Satellite
http://xmlns.com/foaf/0.1/topic_interest
Systems
http://xmlns.com/foaf/0.1/topic_interest
FAULT INJECTION
http://xmlns.com/foaf/0.1/topic_interest
Transient analysis
http://xmlns.com/foaf/0.1/topic_interest
Field-programmable-gate-arrays
http://xmlns.com/foaf/0.1/topic_interest
Transient-effects
http://xmlns.com/foaf/0.1/topic_interest
Concurrent error detection code-based scheme
http://xmlns.com/foaf/0.1/topic_interest
Recovery schemes
http://xmlns.com/foaf/0.1/topic_interest
Built-in current sensor
http://xmlns.com/foaf/0.1/topic_interest
Transient current
http://xmlns.com/foaf/0.1/topic_interest
QDI
https://aurehal.archives-ouvertes.fr/author/735900
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