"Transients"@en . "QKD"@en . "Quantum"@en . "Radiation effects"@en . "Soft error"@fr . "Fault tolerant systems"@en . "Side channels"@en . "Low power"@fr . "Built-in current sensors"@en . "Inertial Navigation System"@en . "Single-event functional interrupts SEFI"@en . "Machine learning algorithm"@en . "Cryptography"@en . "e06c34166a9dc3f404e1c1331d641bda" . "Single soft error detection"@en . "Harware Trojan"@fr . "Entanglement"@en . "Hardware security"@en . "Fault simulation"@fr . "FPGA"@en . "Transient-fault detection"@en . "Hardware Trojan"@en . "Possamai Bastos" . "Run-time test"@fr . "Detection-of-faults"@fr . "Error detection codes"@en . "Transient faults"@fr . "Support vector machine"@en . "Concurrent error dectection codes"@en . "Radiation test"@en . "Body biasing"@fr . "Clocks"@en . "Current signature"@en . "CMOS Transistors"@en . "Circuit and system radiation hardening and mitigation"@en . "Transcient fault"@fr . "Security"@en . "Asynchronous circuits"@fr . "Bulk Built-In Current Sensors"@en . "Soft Error" . "Rodrigo Possamai Bastos" . "QDI circuits"@en . "Level shifter"@fr . "Long-duration transient faults"@en . "Soft errors"@en . "Laser fault injection"@en . . "Trojan detection"@en . "Logic circuits"@en . . "Rodrigo" . "Bulk built-In Current Sensor"@en . "Single Event Upset"@en . "Fault-tolerance" . "FDSOI"@en . "Concurrent detection"@en . "Circuits asynchrones"@fr . "Fault detection"@en . "Transient-fault"@en . "SEU"@en . "Local body-biasing techniques"@en . "Fautes transitoires"@fr . "Concurrent error detection schemes"@en . "Concurrent error detection"@fr . "CubeSat"@en . "Electrical simulation"@en . "Circuit faults"@en . "Attitude Estimation"@en . "Laser"@en . "Transient fault"@fr . "Machine learning"@en . <0000-0002-9964-0424> . <147702321> . "Quasi-delay insensitive"@en . "Asynchronous circuit"@fr . "Fault tolerance"@en . "Radiation-induced soft errors"@en . "Integrated circuit"@fr . "Syst\u00E8mes robustes"@fr . "Timing"@en . "AES"@en . "Methodologies for EDA"@en . . "Built-in-current-sensor"@fr . "Test"@fr . "Transient-faults"@fr . "Single-event upsets SEU"@en . "And security"@en . . "CED code-based scheme"@en . "Registers"@en . "Sensor"@en . "Ir-drop"@en . "Fault attacks"@en . "Thermal neutrons"@en . "Clockless circuit"@en . "Logic circuit"@en . "Transient-faults-sensitivity-evaluation"@en . "Design"@fr . . "Hardware security implementation"@en . "Integrated circuit modeling"@en . "Reliability"@en . "Built-in-sensor"@en . "Short-duration single transient fault"@en . "Satellite"@en . "Systems"@en . "FAULT INJECTION"@en . "Transient analysis"@en . "Field-programmable-gate-arrays"@en . "Transient-effects"@en . "Concurrent error detection code-based scheme"@en . "Recovery schemes"@en . "Built-in current sensor"@fr . "Transient current"@en . "QDI"@fr .