https://data.archives-ouvertes.fr/author/859525

https://data.archives-ouvertes.fr/author/859525

http://xmlns.com/foaf/0.1/topic_interest Transmission electron microscopy
http://xmlns.com/foaf/0.1/interest https://data.archives-ouvertes.fr/subject/phys.nexp
http://xmlns.com/foaf/0.1/topic_interest Heavy ions
http://xmlns.com/foaf/0.1/topic_interest Irradiation
http://xmlns.com/foaf/0.1/topic_interest Nuclear interactions
http://xmlns.com/foaf/0.1/topic_interest Irradiation aux ions lourds
http://xmlns.com/foaf/0.1/topic_interest Ti3SiC2
http://xmlns.com/foaf/0.1/topic_interest Interactions nucléaires et électroniques
http://xmlns.com/foaf/0.1/interest https://data.archives-ouvertes.fr/subject/spi.opti
http://xmlns.com/foaf/0.1/topic_interest Swift heavy ions
http://xmlns.com/foaf/0.1/topic_interest Neutron detector
http://xmlns.com/foaf/0.1/topic_interest Thermoluminescence
http://xmlns.com/foaf/0.1/topic_interest Tisub3/subSiCsub2/sub
http://xmlns.com/foaf/0.1/topic_interest Triple point effect
http://xmlns.com/foaf/0.1/topic_interest Low-Incidence X-Ray Diffraction
http://xmlns.com/foaf/0.1/familyName Nappé
http://xmlns.com/foaf/0.1/topic_interest AFM
http://xmlns.com/foaf/0.1/firstName Jean-Christophe
http://xmlns.com/foaf/0.1/topic_interest Ions lourds
http://www.w3.org/1999/02/22-rdf-syntax-ns#type http://xmlns.com/foaf/0.1/Person
http://xmlns.com/foaf/0.1/topic_interest Diffraction des rayons X sous faible incidence
http://xmlns.com/foaf/0.1/mbox_sha1sum 757458efc6d5e47c85488fdc378d353b
http://xmlns.com/foaf/0.1/interest https://data.archives-ouvertes.fr/subject/spi.gproc
http://xmlns.com/foaf/0.1/topic_interest Optical absorption spectrophotometry
http://xmlns.com/foaf/0.1/topic_interest MEB
http://xmlns.com/foaf/0.1/topic_interest Microscopie électronique en transmission
http://xmlns.com/foaf/0.1/topic_interest Ionic irradiations
http://xmlns.com/foaf/0.1/interest https://data.archives-ouvertes.fr/subject/phys.cond.cm-ms
http://xmlns.com/foaf/0.1/topic_interest Swelling
http://xmlns.com/foaf/0.1/topic_interest Scanning Electron Microscopy
http://xmlns.com/foaf/0.1/topic_interest DRX sous Incidence Rasante
http://xmlns.com/foaf/0.1/topic_interest Nuclear and electronic interactions
http://xmlns.com/foaf/0.1/topic_interest Atomic Force Microscopy
http://xmlns.com/foaf/0.1/interest https://data.archives-ouvertes.fr/subject/phys.phys.phys-data-an
http://xmlns.com/foaf/0.1/topic_interest Partial discharge PD
http://xmlns.com/foaf/0.1/topic_interest Irradiations ioniques
http://xmlns.com/foaf/0.1/topic_interest Krypton
http://xmlns.com/foaf/0.1/topic_interest AlN
http://xmlns.com/foaf/0.1/topic_interest High temperature
http://xmlns.com/foaf/0.1/topic_interest DRX sous faible incidence
http://xmlns.com/foaf/0.1/topic_interest Nuclear collisions
http://xmlns.com/foaf/0.1/topic_interest Sodium-cooled fast reactors
http://xmlns.com/foaf/0.1/topic_interest Fission chamber
http://xmlns.com/foaf/0.1/topic_interest Microscopie à force atomique
http://xmlns.com/foaf/0.1/topic_interest Electronic interactions
http://xmlns.com/foaf/0.1/name Jean-Christophe Nappé
https://aurehal.archives-ouvertes.fr/author/859525

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